Structurally Fundamental Study of Polyaniline


Structurally Fundamental Study of Polyaniline

H. S. Patel, D. H. Viroja

H. S. Patel, D. H. Viroja "Structurally Fundamental Study of Polyaniline" Published in International Journal of Trend in Research and Development (IJTRD), ISSN: 2394-9333, Volume-1 | Issue-2 , December 2014, URL: http://www.ijtrd.com/papers/IJTRD13380.pdf

Electronically conducting polymers have a conjugated structure, i.e. alternating single and double bonds between the carbon atoms of the main chain. The X-Ray powder diffraction is used to obtain information about the structure, composition, and state of emeraldine base PANI materials. Some typical applications are: identification of an unknown based on the crystalline peaks, at room temperature studies, precise measurements of lattice constant and residual strains, and refinement of atomic coordinates. Scanning electron microscope (SEM) is involves scanning of an electron beam across a sample surface and secondary electrons are ejected from the surface. SEM images are used to examine the surface morphology and microstructure or to investigate the inner microstructure from fracture cross-sections. Since the visual observation has some limitations, the microstructural investigations of material require much higher resolution. Transmission electron microscopy with its high resolution capability offers itself as a suitable tool for this purpose. The PANI powder gain size in the range of around 150 nm.

PANI, XRD, SEM, TEM


Volume-1 | Issue-2 , December 2014

2394-9333

IJTRD13380
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